Test Handlers

Other Products


S1 - Engineering Model

sx2400



  • Description
  • Device Type
  • Device size
  • Device thickness
  • Temp. Range
  • Index time
  • UPH
  • Test site
  • Temp accuracy
  • Contact Force
  • Specification
  • BGA, CSP, QFN, BCC, QFP, TSOP
  • 1X1~100X100 (mm)
  • 0.4~5.0
    ( mm )
  • -80 to 175 degrees
  • 9.5 seconds (11.3 with Precisor)
  • 1ch:380 (320 with precisor)
  • Single
  • ±3(-40 ~ +125),±5(+125 ~ +175)
  • 80 kgf